Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations

Autor: Alisson Kwiatkowski da Silva, Isabelle Mouton, Agnieszka Szczepaniak, Zirong Peng, Huan Zhao, Philipp Kürnsteiner, Dirk Ponge, Paraskevas Kontis, Andrew J. Breen, Dierk Raabe, Yanhong Chang, Torsten Schwarz, Eric Aimé Jägle, Junyang He, Leigh T. Stephenson, Baptiste Gault, Surendra Kumar Makineni
Rok vydání: 2018
Předmět:
PHASE-TRANSFORMATION
Technology
Materials science
Materials Science
Alloy
0204 Condensed Matter Physics
Stacking
LINE
Materials Science
Multidisciplinary
02 engineering and technology
Atom probe
STRUCTURAL STATES
engineering.material
01 natural sciences
Atomic units
Measure (mathematics)
law.invention
law
0103 physical sciences
FIELD-ION MICROSCOPY
General Materials Science
DISLOCATIONS
0912 Materials Engineering
Materials
010302 applied physics
LATTICE-DEFECTS
Science & Technology
Mechanical Engineering
021001 nanoscience & nanotechnology
Condensed Matter Physics
PLANAR DEFECTS
Highly sensitive
Characterization (materials science)
SOLUTE SEGREGATION
Mechanics of Materials
Chemical physics
engineering
STACKING-FAULTS
SINGLE-CRYSTALS
Grain boundary
0210 nano-technology
0913 Mechanical Engineering
Zdroj: Journal of Materials Research. 33:4018-4030
ISSN: 2044-5326
0884-2914
DOI: 10.1557/jmr.2018.375
Popis: Atom probe tomography (APT) is rising in influence across many parts of materials science and engineering thanks to its unique combination of highly sensitive composition measurement and three-dimensional microstructural characterization. In this invited article, we have selected a few recent applications that showcase the unique capacity of APT to measure the local composition at structural defects. Whether we consider dislocations, stacking faults, or grain boundary, the detailed compositional measurements tend to indicate specific partitioning behaviors for the different solutes in both complex engineering and model alloys we investigated.
Databáze: OpenAIRE
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