Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films
| Autor: | Losurdo M., Giangregorio M.M., Capezzuto P., Bruno G., Babudri F., Colangiuli D., Farinola G.M., Naso F. M. Losurdo, M.M. Giangregorio, P. Capezzuto, G. Bruno, F. Babudri, D. Colangiuli, G.M. Farinola, F. Naso |
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| Rok vydání: | 2003 |
| Předmět: |
Spin coating
Materials science genetic structures Mechanical Engineering technology industry and agriculture Metals and Alloys Condensed Matter Physics Microstructure eye diseases Electronic Optical and Magnetic Materials Characterization (materials science) Organic semiconductor Chemical engineering Mechanics of Materials Polymer chemistry Materials Chemistry Deposition (phase transition) Spectroscopic ellipsometry sense organs Thin film |
| Zdroj: | Synthetic metals 138 (2003): 49–53. doi:10.1016/S0379-6779(02)01262-6 info:cnr-pdr/source/autori:Losurdo M., Giangregorio M.M., Capezzuto P., Bruno G., Babudri F., Colangiuli D., Farinola G.M., Naso F. M. Losurdo, M.M. Giangregorio, P. Capezzuto, G. Bruno, F. Babudri, D. Colangiuli, G.M. Farinola, F. Naso/titolo:Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films/doi:10.1016%2FS0379-6779(02)01262-6/rivista:Synthetic metals/anno:2003/pagina_da:49/pagina_a:53/intervallo_pagine:49–53/volume:138 |
| ISSN: | 0379-6779 |
| DOI: | 10.1016/s0379-6779(02)01262-6 |
| Popis: | The correlation between the optical properties and microstructural parameters of organic semiconductor polymeric thin films is investigated by spectroscopic ellipsometry. Different poly(arylenephenylene)-based films have been deposited by spincoating. The effect of deposition conditions on the microstructure and, hence, optical constants of the polymeric thin films and the dependence of the optical properties and π–π∗ transition on the structure of the chain backbone are studied. |
| Databáze: | OpenAIRE |
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