On the capturing of low-energy electrons by DNA

Autor: Shirley S. Daube, S. G. Ray, Ron Naaman
Rok vydání: 2004
Předmět:
Zdroj: Proceedings of the National Academy of Sciences. 102:15-19
ISSN: 1091-6490
0027-8424
DOI: 10.1073/pnas.0407020102
Popis: Many of the mutagenic or lethal effects of ionization radiation can be attributed to damage caused to the DNA by low-energy electrons. To gain insight on the parameters affecting this process, we measured the low-energy electron (
Databáze: OpenAIRE