The use of maximum entropy and Bayesian statistics in ion-beam applications

Autor:	Volker Dose, J. Padayachee, V. M. Prozesky, W. von der Linden, R. Fischer, Chris Ryan
Rok vydání:	1997
Předmět:	Bayesian statistics Physics Ion beam Artificial neural network Physics::Instrumentation and Detectors Principle of maximum entropy Detector Bayesian probability High Energy Physics::Experiment Statistical physics Deconvolution Signal conditioning
Zdroj:	ResearcherID
ISSN:	0094-243X
DOI:	10.1063/1.52523
Popis:	An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d166727fa2e6afbc99421504c435065b https://doi.org/10.1063/1.52523 Zobrazit plný text záznamu