Highly stable low noise/high power AlN/GaN-on-silicon double heterostructure HEMTs operating at 40 GHz

Autor: Riccardo Silvestri, Nathalie Rolland, B. Grimbert, Damien Ducatteau, Enrico Zanoni, Gaudenzio Meneghesso, Y. Tagro, Matteo Meneghini, Farid Medjdoub
Přispěvatelé: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
Jazyk: angličtina
Rok vydání: 2013
Předmět:
Zdroj: Proceedings of 2013 IEEE International Reliability Physics Symposium, IRPS 2013
IEEE International Reliability Physics Symposium, IRPS 2013
IEEE International Reliability Physics Symposium, IRPS 2013, 2013, Monterey, CA, United States. paper 3C.3, 6 p., ⟨10.1109/IRPS.2013.6531985⟩
Popis: In this paper, an emerging double heterostructure high electron mobility transistor (DHFET) based on AlN/GaN/AlGaN grown on silicon substrate is presented. This configuration system allowed state-of-the-art GaN-on-silicon DC, RF output power and noise performances at 40 GHz, paving the way for high performance mmW cost-effective amplifiers. Preliminary reliability assessment has been performed on this new class of RF devices, showing promising mmW GaN-on-Si device stability for the first time.
Databáze: OpenAIRE