Enhancement of Multiwalled Carbon Nanotubes’ Electrical Conductivity Using Metal Nanoscale Copper Contacts and Its Implications for Carbon Nanotube-Enhanced Copper Conductivity
| Autor: | Chris J. Barnett, Richard J. Cobley, James E. McCormack, Andrew R. Barron, Russell R. Chianelli, Eva M. Deemer, Christopher R. Evans, P. R. Dunstan, Jon E. Evans, Alvin Orbaek White |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
Scanning tunneling spectroscopy chemistry.chemical_element 02 engineering and technology Carbon nanotube Conductivity Tungsten 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Copper 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention General Energy Electrical resistance and conductance chemistry Chemical engineering law Electrical resistivity and conductivity Density of states Physical and Theoretical Chemistry 0210 nano-technology |
| Zdroj: | The Journal of Physical Chemistry C. 124:18777-18783 |
| ISSN: | 1932-7455 1932-7447 |
| Popis: | Herein, we present an experimental/computational approach for probing the interaction between metal contacts and carbon nanotubes (CNTs) with regard to creating the most efficient, low resistance junction. Tungsten probes have been coated with copper or chromium and the efficiency of nanocontact transport into multiwalled carbon nanotubes (MWCNTs) has been investigated experimentally, using scanning tunneling spectroscopy and nanoscale two-point probe I-V measurements, and in silico, employing DFT calculations. Experimental I-V measurements suggest the relative conductivity of the metal-CNT interaction to be Cu > W > Cr. It has been found that copper when in contact with MWCNTs results in a high density of states at the Fermi level, which contributes states to the conduction band. It was observed that the density of states also increased when chromium and tungsten probes were in contact with CNTs; however, in these cases the density of states increase would only occur under high voltage/high temperature situations. This is demonstrated by an increase in the experimental electrical resistance when compared to the copper probe. These results suggest that in future copper tips should be used when carrying out all intrinsic conduction measurements on CNTs, and they also provide a rationale for the ultraconductivity of Cu-CNT and Cu-graphene composites. |
| Databáze: | OpenAIRE |
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