Failure Physics and Reliability of GaN‐Based HEMTs for Microwave and Millimeter‐Wave Applications: A Review of Consolidated Data and Recent Results

Autor:	Enrico Zanoni, Fabiana Rampazzo, Carlo De Santi, Zhan Gao, Chandan Sharma, Nicola Modolo, Giovanni Verzellesi, Alessandro Chini, Gaudenzio Meneghesso, Matteo Meneghini
Rok vydání:	2022
Předmět:	reliability HEMTs microwave Surfaces and Interfaces degradation failure mechanisms gallium nitride millimeter-wave Condensed Matter Physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Materials Chemistry Electrical and Electronic Engineering
Zdroj:	Physic Status Solid a
ISSN:	1862-6319 1862-6300
DOI:	10.1002/pssa.202100722
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd69c0450bb121933ba7d46226598233 https://doi.org/10.1002/pssa.202100722 Zobrazit plný text záznamu Plný text