Local probing of the polarization state in thin Pb(ZrTi)O-3 films during polarization reversal
| Autor: | Th. Rasing, E. Ph. Pevtsov, Elena Mishina, N. E. Sherstyuk, A. S. Sigov, P.K. Larsen, M. P. Moret, K. A. Vorotilov, S. A. Rössinger |
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| Rok vydání: | 2001 |
| Předmět: |
Applied Materials Science
Materials science Physics and Astronomy (miscellaneous) Condensed matter physics business.industry Scanning Probe Microscopy Physics::Optics Dielectric Dielectric thin films Dielectric hysteresis Polarization (waves) Ferroelectricity Condensed Matter::Materials Science Sine wave Optics Frequency conversion Condensed Matter::Superconductivity Spectroscopy of Solids and Interfaces business GeneralLiterature_REFERENCE(e.g. dictionaries encyclopedias glossaries) Voltage |
| Zdroj: | Applied Physics Letters, 78, 6, pp. 796-798 Applied Physics Letters, 78, 796-798 |
| ISSN: | 0003-6951 |
| Popis: | The polarization state of a thin Pb(ZrTi)O3 film is probed by optical second-harmonic generation (SHG) while applying an external voltage (a sine wave). A hysteresis in the SHG intensity is observed that corresponds to the dielectric hysteresis and is analyzed using a phenomenological relation between the SHG intensity and the dielectric polarization. Based on this model, the polarization state of the film during polarization reversal is mapped. |
| Databáze: | OpenAIRE |
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