Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope
Autor: | S.A. Gudoshnikov, O.V. Snigirev, A.M. Tishin, Jakob Bohr, K.E. Andreev |
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Jazyk: | angličtina |
Rok vydání: | 1997 |
Předmět: | |
Zdroj: | Snigirev, O V, Andreev, K E, Tishin, A M, Gudoshnikov, S A & Bohr, J 1997, ' Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope ', Physical Review B, vol. 55, no. 21, pp. 14429-14433 . https://doi.org/10.1103/PhysRevB.55.14429 |
Popis: | We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom. |
Databáze: | OpenAIRE |
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