Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

Autor:	S.A. Gudoshnikov, O.V. Snigirev, A.M. Tishin, Jakob Bohr, K.E. Andreev
Jazyk:	angličtina
Rok vydání:	1997
Předmět:	ANISOTROPY Materials science Microscope Condensed matter physics Dc squid SURFACE MONOLAYERS CROSSOVER law.invention ULTRATHIN FILMS CO INPLANE Scanning SQUID microscopy law Condensed Matter::Superconductivity Monolayer MULTILAYERS Magnetic force microscope Anisotropy BCC BEHAVIOR
Zdroj:	Snigirev, O V, Andreev, K E, Tishin, A M, Gudoshnikov, S A & Bohr, J 1997, ' Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope ', Physical Review B, vol. 55, no. 21, pp. 14429-14433 . https://doi.org/10.1103/PhysRevB.55.14429
Popis:	We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ccd4420b4939396ca80da640fccc0f56 https://orbit.dtu.dk/en/publications/2e2b3eac-51ea-4098-b33a-2b6d3427d42a Zobrazit plný text záznamu