On the right-angle X-junction diffraction model
| Autor: | John D. Love, S. J. Hewlett, François Ladouceur |
|---|---|
| Rok vydání: | 1995 |
| Předmět: |
Physics
Diffraction business.industry Right angle Diffraction model Telecommunications network Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Validity range Optics Beam propagation method Minimum deviation Electrical and Electronic Engineering business Computer communication networks |
| Zdroj: | ResearcherID |
| ISSN: | 1572-817X 0306-8919 |
| DOI: | 10.1007/bf00631752 |
| Popis: | We review the important features of the right-angle X-junction diffraction model and discuss both its theoretical framework and its validity range. In addition, we present explicit new results from BPM calculations that show that the analytical model aptly describes the dominant physical processes involved and provides bounds on the numerical results. We also address some misinterpretations of the model that have recently appeared in the literature. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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