Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor

Autor:	Carl M. Szabo, Matthew J. Kay, Martin A. Carts, Adam R. Duncan, Robert A. Gigliuto, Matthew J. Gadlage, Dave Ingalls, Kenneth A. LaBel, Timothy Sinclair
Rok vydání:	2013
Předmět:	Automatic test equipment Engineering Software CMOS business.industry Embedded system Total dose Central processing unit State (computer science) Dose rate business Indentation hardness Simulation
Zdroj:	2013 IEEE Radiation Effects Data Workshop (REDW).
DOI:	10.1109/redw.2013.6658198
Popis:	Hardness assurance test results of an Advanced Micro Devices, Inc. (AMD) 32 nm processor for total dose and dose rate response are presented. Testing was performed using commercial motherboards and software stress applications versus more traditional automated test equipment (ATE).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc66ed03aa8cd5a9f32896d781486863 https://doi.org/10.1109/redw.2013.6658198 Zobrazit plný text záznamu