A reliability test-plan for series systems with components having stochastic failure rates
| Autor: | J.H. Nair, S.V. Sabnis |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2002 |
| Předmět: |
Exponential-logarithmic distribution
Mathematical optimization Uniform distribution (continuous) Exponential distribution Design Series (mathematics) Cost Minimization Computer Science::Software Engineering Parallel System Consumer Risk Stochastic simulation Applied mathematics Phase-type distribution Component Testing Electrical and Electronic Engineering System Reliability Safety Risk Reliability and Quality Probability integral transform Producer Risk Random variable Kuhn-Tucker Conditions Mathematics |
| Zdroj: | IndraStra Global. |
| ISSN: | 2381-3652 |
| Popis: | This paper proposes a reliability test plan for a series system, by considering the parameter /spl lambda//sub j/ of the exponential distribution to be a random variable having uniform distribution over [0, /spl theta//sub j/], j = 1, 2,..., n. Explicit expressions are obtained for the optimal values of the t/sub j/, when the number of components in the system is 2. The general solution, albeit implicit, has also been obtained when the number of components in a given system is /spl ges/3. Mathematical programming is used to find the optimal solution and to illustrate it with numerical results. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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