Suppression of Phase Transformation in Nb-H Thin Films below Switchover Thickness
| Autor: | Vladimir Burlaka, Magnus Hamm, Astrid Pundt, Stefan Wagner |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Materials science
Hydrogen Niobium chemistry.chemical_element Bioengineering Nanotechnology 02 engineering and technology 010402 general chemistry 01 natural sciences law.invention Stress (mechanics) Hydrogen storage law Phase (matter) General Materials Science Thin film Mechanical Engineering General Chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 0104 chemical sciences chemistry Chemical engineering Scanning tunneling microscope Absorption (chemistry) 0210 nano-technology |
| Zdroj: | Nano letters. 16(10) |
| ISSN: | 1530-6992 |
| Popis: | Hydrogen uptake in metal–hydrogen (M–H) nanosized systems (e.g., thin films, clusters) is both a fundamental and a technologically relevant topic, which is becoming more important due to the recent developments of hydrogen sensors, purification membranes, and hydrogen storage solutions. It was recently shown that hydrogen (H) absorption in nanosized systems adhered to rigid substrates can lead to ultrahigh mechanical stress in the GPa range. About −10 GPa (compressive) stress were reported for hydrogen loaded niobium (Nb) thin films. Such high stresses can be achieved when conventional stress-release channels are closed, e.g., by reducing the system size. In this paper, we demonstrate that the high stress can be used to strongly modify the system’s thermodynamics. In particular, a complete suppression of the phase transformation is achieved by reducing the film thickness below a switchover value dso. Combined in situ scanning tunneling microscopy (STM) and in situ X-ray diffraction (XRD) measurements serv... |
| Databáze: | OpenAIRE |
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