Autor: |
D. Busse, Alain Dijkstra, Jens Renè Suckert, Claudia Rödl, M. A. J. V. Tilburg, V. T. V. Lange, Jos E. M. Haverkort, Marcel A. Verheijen, Jürgen Furthmüller, Silvana Botti, Erik P. A. M. Bakkers, Elham M. T. Fadaly, Friedhelm Bechstedt, Jonathan J. Finley |
Přispěvatelé: |
Advanced Nanomaterials & Devices, Plasma & Materials Processing, Center for Quantum Materials and Technology Eindhoven, Atomic scale processing, EIRES, Optics of hex-SiGe |
Jazyk: |
angličtina |
Rok vydání: |
2020 |
Předmět: |
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Zdroj: |
2020 Conference on Lasers and Electro-Optics, CLEO 2020-Proceedings |
Popis: |
Hexagonal SiGe is a direct bandgap semiconductor due to zone folding. A Lasher- Stern-Wurfel fit of the photoluminescence spectrum unambiguously confirms band- to-band recombination. The transition matrix elements are large since the translational symmetry is broken. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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