Reflectance dependence of polytetrafluoroethylene on thickness for xenon scintillation light
| Autor: | Elizabeth Batista, Yuhan Wang, K. Pushkin, Aaron Sander, Alissa Neff, Daniel Morton, Matt Okunawo, M. Arthurs, Scott Stephenson, Wolfgang Lorenzon, Jonathan Haefner |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Nuclear and High Energy Physics
Physics - Instrumentation and Detectors chemistry.chemical_element FOS: Physical sciences medicine.disease_cause 01 natural sciences chemistry.chemical_compound Optics Xenon 0103 physical sciences medicine Carbon–fluorine bond 010306 general physics Instrumentation Physics Scintillation Polytetrafluoroethylene 010308 nuclear & particles physics business.industry Instrumentation and Detectors (physics.ins-det) Wavelength Outgassing chemistry Optoelectronics Reflective surfaces business Ultraviolet |
| DOI: | 10.48550/arxiv.1608.01717 |
| Popis: | Many rare event searches including dark matter direct detection and neutrinoless double beta decay experiments take advantage of the high VUV reflective surfaces made from polytetrafluoroethylene (PTFE) reflector materials to achieve high light collection efficiency in their detectors. As the detectors have grown in size over the past decade, there has also been an increased need for ever thinner detector walls without significant loss in reflectance to reduce dead volumes around active noble liquids, outgassing, and potential backgrounds. We report on the experimental results to measure the dependence of the reflectance on thickness of two PTFE samples at wavelengths near 178 nm. No change in reflectance was observed as the thickness of a cylindrically shaped PTFE vessel immersed in liquid xenon was varied between 1 mm and 9.5 mm. Comment: 7 pages, 10 figures |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|