Ultralow Power System-on-Chip SRAM Characterization by Alpha and Neutron Irradiation
| Autor: | Eran Mazal-Tov, Roberto Senesi, Christopher D. Frost, Eitan Keren, Carla Andreani, Enrico Preziosi, Nir M. Yitzhak, Tzach Hadas, Uzi Zangi, Carlo Cazzaniga, A. Haran, D. David, Nati Refaeli |
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| Rok vydání: | 2021 |
| Předmět: |
Nuclear and High Energy Physics
subthreshold voltage Radiation effects Single event upsets system-on-chip (SoC) Hardware_PERFORMANCEANDRELIABILITY multiple bit upset (MBU) Atmospheric measurements Upset Electric power system Gate array Sea measurements Hardware_INTEGRATEDCIRCUITS single-event upset (SEU) Static random-access memory Hardware_ARITHMETICANDLOGICSTRUCTURES Electrical and Electronic Engineering neutron irradiation Field-programmable gate array Alpha particles Neutrons Physics Semiconductor device measurement static random access memory (SRAM) Hardware_MEMORYSTRUCTURES business.industry Subthreshold conduction Settore FIS/07 Electrical engineering Random access memory Nuclear Energy and Engineering Node (circuits) business Voltage |
| Zdroj: | IEEE Transactions on Nuclear Science. 68:2598-2608 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2021.3112622 |
| Popis: | The static random access memory (SRAM) of an ultralow power system-on-chip (SoC) was tested for single-event upsets (SEUs) using alpha particles and neutron beam sources. The measurements are compared to those of an SRAM-based field-programmable gate array (FPGA), built on a similar technology node. The results reveal opposite trends in the two devices regarding the upsets of the logic states, as well as differences in the dependence of SEU cross section (CS) on the operation voltage. The sensitivity of the SoC SRAM to multiple bit upsets with the different radiation sources is analyzed as well. The results demonstrate that the unique SoC design, which enables complete near/subthreshold operation, does not compromise the SoC bit upset tolerance compared to devices of similar technology node which operate at higher voltages. |
| Databáze: | OpenAIRE |
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