Single-hole tunneling through a two-dimensional hole gas in intrinsic silicon

Autor: Filipp Mueller, Joost Ridderbos, Matthias Brauns, P. C. Spruijtenburg, W. G. van der Wiel, A. W. Leenstra, Antonius A.I. Aarnink, Floris A. Zwanenburg
Jazyk: angličtina
Rok vydání: 2013
Předmět:
Zdroj: Applied physics letters, 102(19). American Institute of Physics
ISSN: 0003-6951
DOI: 10.1063/1.4804555
Popis: In this letter we report single-hole tunneling through a quantum dot in a two-dimensional hole gas, situated in a narrow-channel field-effect transistor in intrinsic silicon. Two layers of aluminum gate electrodes are defined on Si/SiO$_2$ using electron-beam lithography. Fabrication and subsequent electrical characterization of different devices yield reproducible results, such as typical MOSFET turn-on and pinch-off characteristics. Additionally, linear transport measurements at 4 K result in regularly spaced Coulomb oscillations, corresponding to single-hole tunneling through individual Coulomb islands. These Coulomb peaks are visible over a broad range in gate voltage, indicating very stable device operation. Energy spectroscopy measurements show closed Coulomb diamonds with single-hole charging energies of 5--10 meV, and lines of increased conductance as a result of resonant tunneling through additional available hole states.
Comment: 4 pages, 4 figures. This article has been submitted to Applied Physics Letters
Databáze: OpenAIRE