IMAGING 0.4 nm SINGLE-WALLED CARBON NANOTUBES WITH ATOMIC FORCE MICROSCOPY
| Autor: | Jianting Ye, Tao Su, Chun Zhang, Hongwei Yang, Zikang Tang, Xieqiu Zhang, Ning Wang, Xudong Xiao, Kin Ming Ho |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Materials science
Single-walled carbon nanotubes atomic force microscopy Nanotechnology Surfaces and Interfaces Substrate (electronics) Adhesion Carbon nanotube Condensed Matter Physics Surfaces Coatings and Films law.invention Matrix (chemical analysis) Crystal symbols.namesake law Materials Chemistry symbols Sample preparation Zeolite Raman spectroscopy |
| Zdroj: | Surface Review and Letters. 14:687-692 |
| ISSN: | 1793-6667 0218-625X |
| DOI: | 10.1142/s0218625x07009931 |
| Popis: | The discovery of the single-walled carbon nanotubes (SWCNTs) with a diameter of 0.4 nm has attracted extensive attentions. In this paper we report our attempt with two methods to directly observe these SWCNTs by AFM. The first one is to deposit the SWCNTs extracted from the zeolite matrix to a flat surface for AFM observation. While one-dimensional features have been observed, the SWCNT was suspected not to adhere well to the substrate. To overcome the difficulties of weak adhesion, we attempt to expose only part of the SWCNT from the zeolite channel by cutting the zeolite crystal at an angle. This alternative method, in which the SWCNT contained zeolite crystal is polished and etched by HCl, however, did not result in a smooth enough surface and thus no one-dimensional features can be observed. The difficulties in sample preparation and possible improvements are discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|