Total dose bias dependency and ELDRS effects in bipolar linear devices

Autor:	T. D. Minto, C.C. Yui, J. M. Lehman, M.D. Wiedeman, Bernard G. Rax, S.S. McClure
Rok vydání:	2003
Předmět:	Materials science Total dose Electronic engineering Test method Sensitivity (control systems) Low dose rate Dose rate Automatic testing Life testing Biomedical engineering
Zdroj:	IEEE Radiation Effects Data Workshop.
DOI:	10.1109/redw.2002.1045543
Popis:	Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited enhanced low dose rate sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrates results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7d28664912bfe8629bf8cd04a40d9bf https://doi.org/10.1109/redw.2002.1045543 Zobrazit plný text záznamu