Laboratory total reflection X-ray fluorescence analysis for low concentration samples

Autor:	Giorgio Cappuccio, C. Polese, S.B. Dabagov, Dariush Hampai, A. Liedl
Rok vydání:	2014
Předmět:	Total internal reflection Chemistry Analytical chemistry Synchrotron radiation X-ray fluorescence Fluorescence Atomic and Molecular Physics and Optics Analytical Chemistry Elemental analysis Total external reflection Instrumentation Spectroscopy Beam (structure) Volume concentration
Zdroj:	Spectrochimica Acta Part B: Atomic Spectroscopy. 101:114-117
ISSN:	0584-8547
DOI:	10.1016/j.sab.2014.07.020
Popis:	Quantitative elemental determination for concentrations in the ppb range requires a careful preparation of the sample. In particular, for elemental analysis of very low concentration samples, less than 1 ng/mm 2 , a very bright X-ray source, typically synchrotron radiation (SR) in total external reflection fluorescence regime (SR-TXRF), is required. Here, we wish to demonstrate that a conventional source combined with a polycapillary semi-lens can provide a quasi-parallel beam intense enough for desktop TXRF analysis of low concentration samples.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c798040fc13290454e787f9acfca2966 https://doi.org/10.1016/j.sab.2014.07.020 Zobrazit plný text záznamu Full Text from ScienceDirect