Enhanced imaging in low dose electron microscopy using electron counting
| Autor: | A. Clark, A.R. Faruqi, Greg McMullan, Renato Turchetta |
|---|---|
| Rok vydání: | 2009 |
| Předmět: |
Physics
CMOS sensor Electron counting business.industry CMOS Electrons Electron DQE Article Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Detective quantum efficiency Microscopy Electron MTF Optics Optical transfer function Computer Simulation Nyquist frequency business Event (particle physics) Instrumentation |
| Zdroj: | Ultramicroscopy |
| ISSN: | 0304-3991 |
| DOI: | 10.1016/j.ultramic.2009.07.004 |
| Popis: | We compare the direct electron imaging performance at 120keV of a monolithic active pixel sensor (MAPS) operated in a conventional integrating mode with the performance obtained when operated in a single event counting mode. For the combination of sensor and incident electron energy used here, we propose a heuristic approach with which to process the single event images in which each event is renormalised to have an integrated weight of unity. Using this approach we find enhancements in the Nyquist frequency modulation transfer function (MTF) and detective quantum efficiency (DQE) over the corresponding integrating mode values by factors of 8 and 3, respectively. |
| Databáze: | OpenAIRE |
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