High-resolution core-level photoemission measurements on the pentacene single crystal surface assisted by photoconduction
| Autor: | Hisao Ishii, Yuki Uragami, Nobuo Ueno, Masayuki Yamamoto, Keiichirou Yonezawa, Satoshi Kera, Kazuhiko Mase, Yasuo Nakayama |
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| Rok vydání: | 2016 |
| Předmět: |
Materials science
Analytical chemistry 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Electron spectroscopy Pentacene Crystal Organic semiconductor Condensed Matter::Materials Science chemistry.chemical_compound X-ray photoelectron spectroscopy chemistry Condensed Matter::Superconductivity 0103 physical sciences General Materials Science Charge carrier 010306 general physics 0210 nano-technology Spectroscopy Single crystal |
| Zdroj: | Journal of Physics: Condensed Matter. 28:094001 |
| ISSN: | 1361-648X 0953-8984 |
| DOI: | 10.1088/0953-8984/28/9/094001 |
| Popis: | Upon charge carrier transport behaviors of high-mobility organic field effect transistors of pentacene single crystal, effects of ambient gases and resultant probable 'impurities' at the crystal surface have been controversial. Definite knowledge on the surface stoichiometry and chemical composites is indispensable to solve this question. In the present study, high-resolution x-ray photoelectron spectroscopy (XPS) measurements on the pentacene single crystal samples successfully demonstrated a presence of a few atomic-percent of (photo-)oxidized species at the first molecular layer of the crystal surface through accurate analyses of the excitation energy (i.e. probing depth) dependence of the C1s peak profiles. Particular methodologies to conduct XPS on organic single crystal samples, without any charging nor damage of the sample in spite of its electric insulating character and fragility against x-ray irradiation, is also described in detail. |
| Databáze: | OpenAIRE |
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