Effect of film thickness on the dielectric properties and charge storage in PMMA thin films
| Autor: | Samuel Behar, Gilbert Teyssedre, Jordi Orrit-Prat, Laurence Ressier, Christina Villeneuve, Regis Diaz, Laurent Boudou |
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| Přispěvatelé: | LAboratoire PLasma et Conversion d'Energie (LAPLACE), Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT), Diélectriques Solides et Fiabilité (LAPLACE-DSF), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Laboratoire de physique et chimie des nano-objets (LPCNO), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche sur les Systèmes Atomiques et Moléculaires Complexes (IRSAMC), Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2013 |
| Předmět: |
Spin coating
Materials science [SPI.NRJ]Engineering Sciences [physics]/Electric power Analytical chemistry Dielectric Conductivity Thermal conduction polymethylmethacrylate thin films Electrical resistivity and conductivity Electric field charge writing by atomic force microscopy conductivity Composite material Thin film Glass transition Kelvin force microscopy |
| Zdroj: | 2013 IEEE International Conference on Solid Dielectrics (ICSD) ICSD : IEEE International Conference on Solid Dielectrics, Bologna, Italy ICSD : IEEE International Conference on Solid Dielectrics Bologna, Italy, Jun 2013, Bologna, Italy. pp.350-353, ⟨10.1109/ICSD.2013.6619883⟩ |
| DOI: | 10.1109/ICSD.2013.6619883⟩ |
| Popis: | International audience; In this work, we demonstrate the excellent charge retention capability of spin-coated Polymethylmethacrylate (PMMA) 200 nm thin films previously charged by atomic force microscopy. In order to elucidate the mechanisms involved in the charge transport and charge storage in PMMA films, the conductivity of 200nm thin PMMA films was analyzed on Metal-Insulation-Metal (MIM) structures. A wide range of electric fields was applied on these structures and the charge and discharge currents were recorded. The thermal dependence of the conduction mechanisms was determined for temperatures below the PMMA glass transition temperature. These results were compared to those obtained for 50μm thick PMMA films in which the conductivity appears much smaller. The effects of PMMA thickness on charge transport are discussed.. |
| Databáze: | OpenAIRE |
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