Antibacterial and Antifungal Activities of PMMAs Implanted Fluorine and/or Silver Ions by Plasma-Based Ion Implantation with Argon
Autor: | Rie Imataki, Kenji Arita, Yoko Abe, Yukari Shinonaga, Keiichi Kagami, Kyoko Harada, Takako Nishimura |
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Jazyk: | angličtina |
Rok vydání: | 2020 |
Předmět: |
chemistry.chemical_element
02 engineering and technology lcsh:Technology Article Ion Contact angle 03 medical and health sciences 0302 clinical medicine X-ray photoelectron spectroscopy antibacterial effect fluorine General Materials Science silver lcsh:Microscopy plasma-based ion implantation lcsh:QC120-168.85 Argon lcsh:QH201-278.5 lcsh:T technology industry and agriculture 030206 dentistry 021001 nanoscience & nanotechnology PMMA Ion implantation chemistry lcsh:TA1-2040 argon Fluorine Surface modification lcsh:Descriptive and experimental mechanics lcsh:Electrical engineering. Electronics. Nuclear engineering 0210 nano-technology Luminescence lcsh:Engineering (General). Civil engineering (General) antifungal effect lcsh:TK1-9971 surface modification Nuclear chemistry |
Zdroj: | Materials Volume 13 Issue 20 Materials, Vol 13, Iss 4525, p 4525 (2020) |
ISSN: | 1996-1944 |
Popis: | The purpose of this study was to examine the anti-oral microorganism effects of fluorine and/or silver ions implanted into acrylic resin (PMMA) using plasma-based ion implantation (PBII) with argon gas. The experimental PMMA specimens were implanted with F and Ag ions alone or simultaneously by the PBII method using Ar or Ar/F2 gases and Ag mesh. The surface characteristics were evaluated by X-ray photoelectron spectroscopy (XPS), contact angle measurements, and atomic force microscopy (AFM). Moreover, the antibacterial activity against Streptococcus mutans (S. mutans) and the antifungal activity against Candida albicans (C. albicans) were examined by the adenosine-5&rsquo triphosphate (ATP) emission luminescence method. XPS spectra of the modified specimens revealed peaks due to F in the Ar/F and the Ar/F+Ag groups, and due to Ag in the Ar+Ag and the Ar/F+Ag groups. The water contact angle increased significantly due to the implantation of Ar, F, and Ag. In the AFM observations, the surface roughness of the Ar/F and the Ar/F+Ag groups increased significantly by less than 5 nanometers. The presence of F and Ag was found to inhibit S. mutans growth in the Ar+Ag and the Ar/F+Ag groups. However, this method provided no significant antifungal activity against C. albicans. |
Databáze: | OpenAIRE |
Externí odkaz: | |
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Abstrakt: | The purpose of this study was to examine the anti-oral microorganism effects of fluorine and/or silver ions implanted into acrylic resin (PMMA) using plasma-based ion implantation (PBII) with argon gas. The experimental PMMA specimens were implanted with F and Ag ions alone or simultaneously by the PBII method using Ar or Ar/F2 gases and Ag mesh. The surface characteristics were evaluated by X-ray photoelectron spectroscopy (XPS), contact angle measurements, and atomic force microscopy (AFM). Moreover, the antibacterial activity against Streptococcus mutans (S. mutans) and the antifungal activity against Candida albicans (C. albicans) were examined by the adenosine-5&rsquo<br />triphosphate (ATP) emission luminescence method. XPS spectra of the modified specimens revealed peaks due to F in the Ar/F and the Ar/F+Ag groups, and due to Ag in the Ar+Ag and the Ar/F+Ag groups. The water contact angle increased significantly due to the implantation of Ar, F, and Ag. In the AFM observations, the surface roughness of the Ar/F and the Ar/F+Ag groups increased significantly by less than 5 nanometers. The presence of F and Ag was found to inhibit S. mutans growth in the Ar+Ag and the Ar/F+Ag groups. However, this method provided no significant antifungal activity against C. albicans. |
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ISSN: | 19961944 |