Polarized light-scattering matrix elements for select perfect and perturbed optical surfaces
| Autor: | Vincent J. Iafelice, William S. Bickel |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Materials science
business.industry Scattering Materials Science (miscellaneous) Multiangle light scattering Polarization (waves) Ray Industrial and Manufacturing Engineering Light scattering Optics Illumination angle Business and International Management business Refractive index Circular polarization |
| Zdroj: | Applied optics. 26(12) |
| ISSN: | 1559-128X |
| Popis: | The angular distribution of scattered light depends on the electromagnetic properties (refractive index, absorptivity), the geometrical properties (size, shape, and distribution) of the scatterer(s), as well as the polarization and illumination angle of the incident light. To study the total information content, we measured the entire experimental sixteen-element Mueller scattering matrix for a smooth reflecting aluminum surface illuminated with lambda = 4416-A light at various angles of incidence alpha. In comparison, we also measured the scattering matrix for a degraded surface of identical material. This paper discusses the experimental procedure and compares the scattering results obtained from these two types of surface. |
| Databáze: | OpenAIRE |
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