Structural and Double Layer Forces between Silica Surfaces in Suspensions of Negatively Charged Nanoparticles
| Autor: | Katarzyna Kubiak, Gregor Trefalt, Michal Borkovec, Liam R. J. Scarratt, Plinio Maroni |
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| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Double layer (biology)
Materials science Nanoparticle 02 engineering and technology Surfaces and Interfaces Electrolyte 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Effective nuclear charge Double layer forces 0104 chemical sciences Ion Electrophoresis Chemical physics ddc:540 Electrochemistry General Materials Science 0210 nano-technology Layer (electronics) Spectroscopy |
| Zdroj: | Langmuir, Vol. 36, No 47 (2020) pp. 14443-14452 |
| ISSN: | 0743-7463 |
| Popis: | Direct force measurements between negatively charged silica microparticles are carried out in suspensions of like-charged nanoparticles with the atomic force microscope (AFM). In agreement with previous studies, oscillatory force profiles are observed at larger separation distances. At smaller distances, however, soft and strongly repulsive forces are present. These forces are caused by double layer repulsion between the like-charged surfaces and can be quantitatively interpreted with the Poisson-Boltzmann (PB) model. However, the PB model must be adapted to a strongly asymmetric electrolyte to capture the non-exponential nature of these forces. Thereby, the nanoparticles are modeled as highly charged co-ions, while the counter ions are monovalent. This model permits to extract the effective charge of the nanoparticles, which is well comparable to the one obtained from electrophoresis. The PB model also explains the presence of a particle-free layer close to the interface. |
| Databáze: | OpenAIRE |
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