Influence of target properties on prompt in-beam electron spectra
| Autor: | H. Folger, J.S. Dionisio, Ch. Vieu, Z. Méliani, C. Schück |
|---|---|
| Přispěvatelé: | Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11) |
| Rok vydání: | 1991 |
| Předmět: |
Physics
Nuclear and High Energy Physics Spectrometer 010308 nuclear & particles physics Electron [PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex] Beam electron 01 natural sciences Electron spectroscopy Spectral line 0103 physical sciences Perpendicular Physics::Accelerator Physics Atomic physics 010306 general physics Instrumentation Beam (structure) Doppler broadening |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 1991, 303, pp.9-18 |
| ISSN: | 0168-9002 |
| DOI: | 10.1016/0168-9002(91)90757-h |
| Popis: | Some important physical factors influencing in-beam e-γ measurements are briefly discussed. The close implication between target and beam properties including the reaction products on high resolution in-beam electron spectroscopy is worked out. The influence of the target properties on their Doppler broadening of an electron line analyzed by axial symmetric spectrometers is discussed in detail. A few examples of the target influence on prompt in-beam electron spectra are also presented in the perpendicular geometry, while the important role of electron background reduction techniques is stressed in the forward collinear geometry. |
| Databáze: | OpenAIRE |
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