High resolution subsurface imaging using resonance-enhanced detection in 2nd-harmonic KPFM
| Autor: | Ronald G. Reifenberger, Maria J. Cadena, Arvind Raman |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Kelvin probe force microscope Materials science business.industry Mechanical Engineering Resolution (electron density) Bioengineering 02 engineering and technology General Chemistry 021001 nanoscience & nanotechnology 01 natural sciences Signal Optics Mechanics of Materials Normal mode 0103 physical sciences Microscopy Harmonic High harmonic generation General Materials Science Sensitivity (control systems) Electrical and Electronic Engineering 0210 nano-technology business |
| Zdroj: | Nanotechnology. 29(40) |
| ISSN: | 1361-6528 |
| Popis: | Second harmonic Kelvin probe force microscopy is a robust mechanism for subsurface imaging at the nanoscale. Here we exploit resonance-enhanced detection as a way to boost the subsurface contrast with higher force sensitivity using lower bias voltages, in comparison to the traditional off-resonance case. In this mode, the second harmonic signal of the electrostatic force is acquired at one of the eigenmode frequencies of the microcantilever. As a result, high resolution subsurface images are obtained in a variety of nanocomposites. To further understand the subsurface imaging detection upon electrostatic forces, we use a finite element model that approximates the geometry of the probe and sample. This allows the investigation of the contrast mechanism, the depth sensitivity and lateral resolution depending on tip-sample properties. |
| Databáze: | OpenAIRE |
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