Study of microwave resonances induced by bias lines of shunted Josephson junctions
Autor: | Ugur Yilmaz, Juergen Kunert, Ronny Stolz, Pascal Febvre, Romain Collot, Sasan Razmkhah |
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Jazyk: | angličtina |
Rok vydání: | 2019 |
Předmět: |
Physics
Josephson effect Condensed matter physics Condensed Matter - Superconductivity Resonance FOS: Physical sciences Applied Physics (physics.app-ph) Physics - Applied Physics Condensed Matter Physics Capacitance Microstrip Electronic Optical and Magnetic Materials law.invention Superconductivity (cond-mat.supr-con) law Rapid single flux quantum Condensed Matter::Superconductivity Electrical and Electronic Engineering Resistor Microwave Ground plane |
Popis: | Bias lines routed over a ground plane naturally form microstrip lines associated with the presence of a capacitance. This can lead to unwanted resonances when coupled to Josephson junctions. This work presents an electrical model of a shunted Josephson junction with its bias lines and pads, fabricated with the 1 kA/cm$^2$ RSFQ niobium process of the FLUXONICS Foundry. A compact LCL T-model is used to simulate the microwave behavior of the bias line, predict resonances and design resonance-free superconducting circuits. The I-V characteristics of three shunted Josephson junctions have been obtained from time-domain simulations done with JSIM and show a good match with the global behavior and experimentally observed resonance at 230 GHz, measured at 4.2 K. The influence of the position and value of a series resistor placed on bias lines is studied to damp unwanted resonances at the junction. Presented at ISEC2019 conference |
Databáze: | OpenAIRE |
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