Investigation of Dislocations in 6H-SiC Axial Samples Using Synchrotron X-Ray Topography and Ray Tracing Simulation

Autor:	Hongyu Peng, Stephen Sampayan, Michael Dudley, Tuerxun Ailihumaer, Yafei Liu, Balaji Raghothamachar, Kristin Sampayan
Rok vydání:	2021
Předmět:	Optics Materials science business.industry law X-ray Ray tracing (graphics) business Synchrotron law.invention
Zdroj:	ECS Transactions. 104:147-155
ISSN:	1938-6737 1938-5862
DOI:	10.1149/10407.0147ecst
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c4a1d1ea9e305dfdcaff0bb7cdc103c3 https://doi.org/10.1149/10407.0147ecst Zobrazit plný text záznamu