A MIM capacitor study of dielectric charging for RF MEMS capacitive switches
| Autor: | E. Papandreou, George J. Papaioannou, Loukas Michalas, Matroni Koutsoureli, Anestis Gantis |
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| Rok vydání: | 2015 |
| Předmět: |
Materials science
Capacitive sensing 02 engineering and technology Dielectric Hardware_PERFORMANCEANDRELIABILITY 01 natural sciences law.invention Reliability (semiconductor) law Hardware_GENERAL 0103 physical sciences Hardware_INTEGRATEDCIRCUITS General Environmental Science 010302 applied physics Kelvin probe force microscope Microelectromechanical systems reliability business.industry Electrical engineering RF MEMS 021001 nanoscience & nanotechnology MIM Capacitor General Earth and Planetary Sciences Transient (oscillation) dielectric charging 0210 nano-technology business |
| Popis: | MIM capacitors are considered equally important devices for the assessment of dielectric charging in RF MEMS capacitive switches. Beside the obvious similarities between the down state condition of RF MEMS and MIM capacitors there are also some important differences. The paper aims to introduce a novel approach to the study of dielectric charging in MEMS with the aid of MIM capacitors by combining experimental results obtained by the application of DC, Charging Transient and Kelvin Probe techniques. The strengths and weaknesses are discussed in conjunction with experimental results obtained on SiNx based MIM capacitors and MEMS capacitive switches fabricated under the same conditions. |
| Databáze: | OpenAIRE |
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