Developments in metrology in support of nanotechnology

Autor:	J R Pekelsky, S. Wingar, Shan Zou, B J Eves, D. Goodchild, Linda J. Johnston, N. Kim, Jennifer E. Decker, David Munoz-Paniagua, Mark T. McDermott, A. Bogdanov
Jazyk:	angličtina
Rok vydání:	2009
Předmět:	Engineering metrological nanotechnology business.industry Measurement science Nanotechnology nanoscale calibration Soft materials Characterization (materials science) Metrology Research council Instrumentation (computer programming) business scanning-probe
Zdroj:	Nanotechnology in Construction 3 ISBN: 9783642009792
DOI:	10.1007/978-3-642-00980-8_8
Popis:	Nanotechnology emerges out of fundamental science through capability for accurate, repeatable and reproducible measurements on the nanoscale which allows scientists and engineers to accumulate knowledge. Understanding the measurement science is the first step towards development of new ideas. This paper describes some research initiatives which underpin the development of nanotechnology. Programs underway at the National Research Council of Canada include: development of metrological scanning-probe microscope instrumentation for dimensional calibration, materials characterization, development of artefacts designed specifically for dimensional calibration, investigation of metrology for application to soft materials and investigation of intrinsic length standards for realization of the SI metre at the nanoscale. 3rd International Symposium on Nanotechnology in Construction (NICOM 3), May 31 to June 2, 2009, Prague, Czech Republic
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c44333b2dceb6204a21cec01d50b7928 https://doi.org/10.1007/978-3-642-00980-8_8 Zobrazit plný text záznamu