Influence of a reduced mobility layer on the structural relaxation dynamics of aluminum capped ultrathin films of poly(ethylene terephthalate)
| Autor: | Simone Napolitano, Mario D’Acunto, Mauro Lucchesi, Pierangelo Rolla, Pasqualantonio Pingue, Daniele Prevosto |
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| Přispěvatelé: | Napolitano, S, Prevosto, D, Lucchesi, M, Pingue, Pasqualantonio, D'Acunto, M, Rolla, P. |
| Rok vydání: | 2007 |
| Předmět: |
Materials science
GLASS-TRANSITION TEMPERATURE Substrate (electronics) chemistry.chemical_compound POLYETHYLENE TEREPHTHALATE Polymer chemistry Electrochemistry Polyethylene terephthalate General Materials Science Composite material POLY(METHYL METHACRYLATE) Spectroscopy chemistry.chemical_classification Relaxation (NMR) Surfaces and Interfaces Polymer Condensed Matter Physics Poly(methyl methacrylate) Surface energy chemistry visual_art RAY PHOTOELECTRON-SPECTROSCOPY visual_art.visual_art_medium Polystyrene THIN POLYMER-FILMS Glass transition |
| Zdroj: | Langmuir 23 (2007): 2103–2109. info:cnr-pdr/source/autori:Napolitano, S; Prevosto, D; Lucchesi, M; Pingue, P; D'Acunto, M; Rolla, P/titolo:Influence of a reduced mobility layer on the structural relaxation dynamics of aluminum capped ultrathin films of poly(ethylene terephthalate)/doi:/rivista:Langmuir/anno:2007/pagina_da:2103/pagina_a:2109/intervallo_pagine:2103–2109/volume:23 |
| Popis: | The structural dynamics of ultrathin polymer films of poly(ethylene terephthalate) capped between aluminum electrodes have been investigated by dielectric relaxation spectroscopy. A deviation from bulk behavior, appearing as an increase of the relaxation time at a fixed temperature, is observed for films of thickness below 35 nm. The slowing down acts as a constant shift factor independent from the temperature, and the fragility is constant. The interfacial energy between aluminum and poly(ethylene terephthalate) is calculated to be 3 mJ/m(2), confirming a strong interaction between polymer and substrate, which leads to the presence of a layer characterized by a reduced mobility at their interfaces. We proposed a mathematical schematization of a multylayer model that allowed qualitative reproduction of the observed thickness dependences of the static and dynamic properties. In terms of such a model, the upper limit for the thickness of the reduced mobility layer was estimated as 20 nm. The conditions to extend the proposed model to different observables are finally suggested. |
| Databáze: | OpenAIRE |
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