Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits
| Autor: | Luis A. C. Benites, Mayler G. A. Martins, Samuel Pagliarini, Fernanda Lima Kastensmidt, Paolo Rech |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Triple modular redundancy
Nuclear and High Energy Physics reliability 010308 nuclear & particles physics Design space exploration Computer science neutrons Hardware_PERFORMANCEANDRELIABILITY Integrated circuit Fault injection Chip 01 natural sciences Matrix multiplication law.invention Reliability engineering Nuclear Energy and Engineering law FinFET 0103 physical sciences Redundancy (engineering) Electrical and Electronic Engineering Radiation hardening |
| Zdroj: | IEEE Transactions on Nuclear Science |
| Popis: | In this article, authors explore radiation hardening techniques through the design of a test chip implemented in 16-nm FinFET technology, along with architectural and redundancy design space exploration of its modules. Nine variants of matrix multiplication were taped out and irradiated with neutrons. The results obtained from the neutron campaign revealed that the radiation-hardened variants present superior resiliency when either local or global triple modular redundancy (TMR) schemes are employed. Furthermore, simulation-based fault injection was utilized to validate the measurements and to explore the effects of different implementation strategies on failure rates. We further show that the interplay between these different implementation strategies is not trivial to capture and that synthesis optimizations can effectively break assumptions about the effectiveness of redundancy schemes. |
| Databáze: | OpenAIRE |
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