Probing the nanoscale light emission properties of a CVD-grown MoS2monolayer by tip-enhanced photoluminescence
| Autor: | Yoshito Okuno, Filippo Fabbri, Agnès Tempez, Matteo Bosi, Marc Chaigneau, Cristina Cairone, Ophélie Lancry |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Photoluminescence business.industry 2d materials 02 engineering and technology Chemical vapor deposition 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences chemistry.chemical_compound chemistry Monolayer Microscopy Optoelectronics characterization General Materials Science Light emission MoS2 0210 nano-technology Spectroscopy business Molybdenum disulfide Visible spectrum |
| Zdroj: | Nanoscale info:cnr-pdr/source/autori:Okuno, Yoshito; Lancry, Ophélie; Tempez, Agnès; Cairone, Cristina; Bosi, Matteo; Fabbri, Filippo; Chaigneau, Marc/titolo:Probing the nanoscale light emission properties of a CVD-grown MoS2<%2Finf> monolayer by tip-enhanced photoluminescence/doi:10.1039%2Fc8nr02421a/rivista:Nanoscale (Print)/anno:2018/pagina_da:14055/pagina_a:14059/intervallo_pagine:14055–14059/volume:10 |
| ISSN: | 2040-3372 2040-3364 |
| DOI: | 10.1039/c8nr02421a |
| Popis: | [object Object]Two-dimensional transition metal dichalcogenides are gaining increasing interest due to their promising optical properties. In particular, molybdenum disulfide (MoS2) which displays a band-gap change from indirect at 1.29 eV for bulk materials to direct at 1.8 eV for the material monolayer. This particular effect can lead to a strong light interaction which can pave the way for a new approach to the next generation of visible light emitting devices. In this work we show the nanoscale variation of light emission properties by tip-enhanced photoluminescence microscopy and spectroscopy in the MoS2 monolayer, grown by chemical vapour deposition. The variations of the light emission properties are due to different effects depending on the shape of the MoS2 single layer, for instance, a different concentration of point defect in an irregularly shaped flake and the presence of a nanoscale terrace in a triangular monolayer. Simultaneously, atomic force microscopy reveals indeed the presence of a nanometric terrace, composed of an additional layer of MoS2, and tip-enhanced PL intensity imaging shows a localized intensity decrease. |
| Databáze: | OpenAIRE |
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