Microstructure related photoluminescence in a-CNx films deposited by reactive rf magnetron sputtering

Autor: Michael Lejeune, Ph. Lavallard, C. Barthou, H. J. von Bardeleben, O. Durand-Drouhin, Andreas Zeinert
Přispěvatelé: Laboratoire d'optique des solides (LOS), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Groupe de Physique des Solides (GPS), Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS)
Jazyk: angličtina
Rok vydání: 2004
Předmět:
Zdroj: Solid State Communications
Solid State Communications, Elsevier, 2004, 129 (2), pp.107. ⟨10.1016/j.ssc.2003.09.022⟩
Solid State Communications, 2004, 129 (2), pp.107. ⟨10.1016/j.ssc.2003.09.022⟩
ISSN: 0038-1098
DOI: 10.1016/j.ssc.2003.09.022⟩
Popis: Solid State Communications - Vol. 129, P. 107; International audience; We investigated the photoluminescence (PL) properties of carbon nitride films (CNx) deposited by rf magnetron sputtering and compared them to their microstructure depending on the target self-bias. While many of the data are compatible with ‘a-C:H like' PL properties the observed variation of the PL efficiency η with respect to the target bias cannot be easily explained by the standard models. It is suggested that the observed variation of η is rather dominated by a change in microstructure which depends on the bombardment intensity during growth than by the concentration of non-radiative centres.
Databáze: OpenAIRE