Spatially Resolved Transport Properties of Pristine and Doped Single-Walled Carbon Nanotube Networks
| Autor: | Miran Gaberšček, Patrik Laiho, Esko I. Kauppinen, Antti Kaskela, Albert G. Nasibulin, Andrej Znidarsic, Abdou Hassanien, Yutaka Ohno |
|---|---|
| Rok vydání: | 2013 |
| Předmět: |
ta214
atomic force microscopy Morphology (linguistics) Materials science ta114 carbon nanotubes ta221 Contact resistance Doping Conductance Nanotechnology Carbon nanotube Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention chemistry.chemical_compound General Energy chemistry law Nitric acid Electrical resistivity and conductivity Physical and Theoretical Chemistry Composite material ta218 Sheet resistance |
| Zdroj: | The Journal of Physical Chemistry C. 117:13324-13330 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/jp403983y |
| Popis: | We use noninvasive atomic force microscopy to probe the spatial electrical conductivity of isolated junctions of pristine and nitric acid treated single-walled carbon nanotube networks (SWCNT-N). By analyzing the local IV curves of SWCNTs and bundles with various diameters, the resistance per unit length and the contact resistance of their junctions are estimated to be 3–16 kΩ/μm and 29–532 kΩ, respectively. We find that the contact resistance decreases with increasing SWCNT or bundle diameter and depends on the contact morphology, reaching a value of 29 kΩ at a diameter of 10 nm. A nitric acid treatment moderately dopes SWCNTs and reduces their average contact resistance by a factor of 3 while the resistance of the nanotubes remains largely unaltered. Remarkably, the same treatment on an SWCNT-N shows similar reduction in the sheet resistance by a factor of 4. These results suggest that the resistance reduction mechanism is related to the contact modulation with no major impact on conductance of SWCNTs. |
| Databáze: | OpenAIRE |
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