Optimizing Electromagnetic Fault Injection with Genetic Algorithms

Autor:	Maldini, Antun, Samwel, N., Picek, Stjepan, Batina, L., Breier, J., Hou, X., Bhasin, S.
Přispěvatelé:	Breier, J., Hou, X., Bhasin, S.
Rok vydání:	2019
Předmět:	Computer engineering business.industry Computer science Brute-force search Cryptography Fault injection Digital Security business Rendering (computer graphics)
Zdroj:	Breier, J.; Hou, X.; Bhasin, S. (ed.), Automated Methods in Cryptographic Fault Analysis, 281-300. Cham : Springer International Publishing STARTPAGE=281;ENDPAGE=300;TITLE=Breier, J.; Hou, X.; Bhasin, S. (ed.), Automated Methods in Cryptographic Fault Analysis Breier, J.; Hou, X.; Bhasin, S. (ed.), Automated Methods in Cryptographic Fault Analysis, pp. 281-300 Automated Methods in Cryptographic Fault Analysis ISBN: 9783030113322
Popis:	Fault injection is a serious threat for implementations of cryptography, especially on small embedded devices. In particular, electromagnetic fault injection (EMFI) is a powerful active attack, requiring minimal modifications on the device under attack while having excellent penetration capabilities. The challenge is in finding the right combination of the attack parameters and their values. Namely, the number of possible combinations (for all the values of relevant parameters) is typically huge and rendering exhaustive search impossible.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c00e292a3f1872e2c17559ca664e0b17 http://hdl.handle.net/2066/204497 Zobrazit plný text záznamu