Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry
| Autor: | René Heller, Gregor Hlawacek, James Cookson, Dogan Ozkaya, Nico Klingner, Beverley J. Inkson, Laura Wheatcroft |
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| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Battery (electricity)
Materials science Energy Engineering and Power Technology High voltage Electrolyte Cathode Article Characterization (materials science) law.invention Secondary ion mass spectrometry Time of flight Chemical engineering law surface degradation imaging and chemical characterization Materials Chemistry Electrochemistry helium ion microscopy Chemical Engineering (miscellaneous) Interphase Electrical and Electronic Engineering ToF-SIMS lithium ion batteries SEI/CEI layer |
| Zdroj: | ACS Applied Energy Materials |
| ISSN: | 2574-0962 |
| Popis: | Unstable cathode electrolyte interphase (CEI) formation increases degradation in high voltage Li-ion battery materials. Few techniques couple characterization of nano-scale CEI layers on the macroscale with in situ chemical characterization, and thus, information on how the underlying microstructure affects CEI formation is lost. Here, the process of CEI formation in a high voltage cathode material, LiCoPO4, has been investigated for the first time using helium ion microscopy (HIM) and in situ time-of-flight (ToF) secondary ion mass spectrometry (SIMS). The combination of HIM and Ne-ion ToF-SIMS has been used to correlate the cycle-dependent morphology of the CEI layer on LiCoPO4 with a local cathode microstructure, including position, thickness, and chemistry. HIM imaging identified partial dissolution of the CEI layer on discharge resulting in in-homogenous CEI coverage on larger LiCoPO4 agglomerates. Ne-ion ToF-SIMS characterization identified oxyfluorophosphates from HF attack by the electrolyte and a Li-rich surface region. Variable thickness of the CEI layer coupled with inactive Li on the surface of LiCoPO4 electrodes contributes to severe degradation over the course of 10 cycles. The HIM–SIMS technique has potential to further investigate the effect of microstructures on CEI formation in cathode materials or solid electrolyte interphase formation in anodes, thus aiding future electrode development. |
| Databáze: | OpenAIRE |
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