Negative Index Metamaterial Lens for Subwavelength Microwave Detection
| Autor: | Lalita Udpa, Srijan Datta, Saptarshi Mukherjee, Xiaodong Shi, Yiming Deng, Mahmood Haq, Edward J. Rothwell |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Diffraction
Materials science Physics::Optics TP1-1185 02 engineering and technology metamaterial 01 natural sciences Biochemistry Article Analytical Chemistry law.invention lenses Optics law Nondestructive testing 0202 electrical engineering electronic engineering information engineering Electrical and Electronic Engineering Instrumentation refractive index nondestructive testing business.industry microwave sensors Chemical technology 010401 analytical chemistry Metamaterial 020206 networking & telecommunications Atomic and Molecular Physics and Optics 0104 chemical sciences Characterization (materials science) Lens (optics) Microwave imaging business Refractive index Microwave |
| Zdroj: | Sensors Volume 21 Issue 14 Sensors, Vol 21, Iss 4782, p 4782 (2021) Sensors (Basel, Switzerland) |
| ISSN: | 1424-8220 |
| DOI: | 10.3390/s21144782 |
| Popis: | Metamaterials are engineered periodic structures designed to have unique properties not encountered in naturally occurring materials. One such unusual property of metamaterials is the ability to exhibit negative refractive index over a prescribed range of frequencies. A lens made of negative refractive index metamaterials can achieve resolution beyond the diffraction limit. This paper presents the design of a metamaterial lens and its use in far-field microwave imaging for subwavelength defect detection in nondestructive evaluation (NDE). Theoretical formulation and numerical studies of the metamaterial lens design are presented followed by experimental demonstration and characterization of metamaterial behavior. Finally, a microwave homodyne receiver-based system is used in conjunction with the metamaterial lens to develop a far-field microwave NDE sensor system. A subwavelength focal spot of size 0.82λ was obtained. The system is shown to be sensitive to a defect of size 0.17λ × 0.06λ in a Teflon sample. Consecutive positions of the defect with a separation of 0.23λ was resolvable using the proposed system. |
| Databáze: | OpenAIRE |
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