In Situ Transmission X-ray Micro-Diffraction from Thin Metal Films Electrodeposited in Microfluidic Channels
| Autor: | J. Stettner, Tim Wiegmann, Jakub Drnec, Olaf M. Magnussen, Finn Reikowski, Fouad Maroun |
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| Přispěvatelé: | Christian-Albrechts-Universität zu Kiel (CAU), ESRF-The European Synchrotron, Laboratoire de physique de la matière condensée (LPMC), Centre National de la Recherche Scientifique (CNRS)-École polytechnique (X) |
| Rok vydání: | 2020 |
| Předmět: |
Diffraction
In situ Materials science Renewable Energy Sustainability and the Environment business.industry 020209 energy Microfluidics X-ray [CHIM.MATE]Chemical Sciences/Material chemistry [CHIM.CATA]Chemical Sciences/Catalysis 02 engineering and technology Condensed Matter Physics Epitaxy Surfaces Coatings and Films Electronic Optical and Magnetic Materials X-ray crystallography [CHIM.CRIS]Chemical Sciences/Cristallography 0202 electrical engineering electronic engineering information engineering Materials Chemistry Electrochemistry Optoelectronics Crystallite business Image resolution |
| Zdroj: | Journal of The Electrochemical Society Journal of The Electrochemical Society, Electrochemical Society, 2020, 167 (11), pp.112505. ⟨10.1149/1945-7111/aba077⟩ |
| ISSN: | 1945-7111 0013-4651 |
| Popis: | International audience; High-energy X-ray surface diffraction in transmission geometry is combined with a microfluidic thin layer flow cell for in situ studies of the local structure of electrodeposited epitaxial films. The capabilities of this approach are illustrated using Bi films on Au(100) single crystals as an example. We demonstrate that the local film thickness, the strain, and the orientation of the deposits' crystallites can be mapped with a spatial resolution of a few micrometers. The high heterogeneity of the Bi films provides deposits with a wide range of structural properties, allowing to establish correlations between the different parameters as a function of the local thickness. |
| Databáze: | OpenAIRE |
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