| Popis: |
In steel manufacturing process, one X-ray fluorescence analyzer with 40 crystal spectrometers is sometimes used for elemental compositional monitoring to control the process. The present paper is a suggestion to improve the performance of this bulk of X-ray fluorescence spectrometers by replacing the proportional/scintillation counters by silicon drift detectors (SDD) with digital signal processors (DSP). The wavelength dispersive X-ray fluorescence spectrometer with SDDs will enable the automatic adjustment of the optimal measuring condition. The shortcomings of both SDD and proportional counters are discussed. |
