Wavefront metrology for coherent hard X-rays by scanning a microsphere
| Autor: | Yuriy Chushkin, Eirik Torbjørn Bakken Skjønsfjell, Dag W. Breiby, Nilesh Patil, Alain Gibaud, Federico Zontone |
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| Přispěvatelé: | Norwegian Univ Sci & Technol, Dept Phys, Hogskoleringen 5, N-7491 Trondheim, Norway, European Synchrotron Radiation Facility (ESRF), Institut des Molécules et Matériaux du Mans (IMMM), Le Mans Université (UM)-Centre National de la Recherche Scientifique (CNRS), Le Mans Université (UM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Univ Coll South East Norway, Dept Micro & Nano Syst Technol, Raveien 197, N-3184 Borre, Norway |
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Physics
Wavefront Diffraction [PHYS]Physics [physics] [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] Zernike polynomials business.industry Plane wave X-ray optics Near and far field 02 engineering and technology Wavefront sensor 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics 010309 optics symbols.namesake Optics 0103 physical sciences symbols 0210 nano-technology business ComputingMilieux_MISCELLANEOUS Coherence (physics) |
| Zdroj: | 'Optics Express ', vol: 24, pages: 10710-10722 (2016) Optics Express Optics Express, Optical Society of America, 2016, 24 (10), ⟨10.1364/OE.24.010710⟩ Optics Express, Optical Society of America-OSA Publishing, 2016, 24 (10), 13 p. ⟨10.1364/OE.24.010710⟩ Optics Express, Optical Society of America, 2016, 24 (10), 13 p. ⟨10.1364/OE.24.010710⟩ |
| ISSN: | 1094-4087 |
| Popis: | International audience; Characterization of the wavefront of an X-ray beam is of primary importance for all applications where coherence plays a major role. Imaging techniques based on numerically retrieving the phase from interference patterns are often relying on an a-priori assumption of the wavefront shape. In Coherent X-ray Diffraction Imaging (CXDI) a planar incoming wave field is often assumed for the inversion of the measured diffraction pattern, which allows retrieving the real space image via simple Fourier transformation. It is therefore important to know how reliable the plane wave approximation is to describe the real wavefront. Here, we demonstrate that the quantitative wavefront shape and flux distribution of an X-ray beam used for CXDI can be measured by using a micrometer size metal-coated polymer sphere serving in a similar way as the hole array in a Hartmann wavefront sensor. The method relies on monitoring the shape and center of the scattered intensity distribution in the far field using a 2D area detector while raster-scanning the microsphere with respect to the incoming beam. The reconstructed X-ray wavefront was found to have a well-defined central region of approximately 16 mu m diameter and a weaker, asymmetric, intensity distribution extending 30 mu m from the beam center. The phase front distortion was primarily spherical with an effective radius of 0.55 m which matches the distance to the last upstream beam-defining slit, and could be accurately represented by Zernike polynomials. (C) 2016 Optical Society of America |
| Databáze: | OpenAIRE |
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