Multi-band microwave sensor based on Hilbert’s fractal for dielectric solid material characterization
| Autor: | M. R. T. de Oliveira, Ignacio Llamas-Garro, M. S. Coutinho, J. A. I. Araujo, C. P. do N. Silva, M. T. de Melo |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Materials science
Microwave sensor General Physics and Astronomy 02 engineering and technology Dielectric Solid material multiband sensing 01 natural sciences Resonator Planar Fractal Optics 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electrical and Electronic Engineering fractal geometry dielectric substrates 010302 applied physics business.industry 020206 networking & telecommunications Electronic Optical and Magnetic Materials Characterization (materials science) Multi band resonator business |
| Zdroj: | Journal of Electromagnetic Waves and Applications. 35:848-860 |
| ISSN: | 1569-3937 0920-5071 |
| DOI: | 10.1080/09205071.2020.1861992 |
| Popis: | A planar sensor designed using the fourth Hilbert fractal curve iteration for solid material characterization at multiple frequencies is reported in this paper. The fractal curve is self-similar with space filling properties. The Hilbert fractal geometry is used to form a compact resonator, with a multiband frequency response where miniaturization is achieved, since a large transmission line length is effectively confined in a limited area. The sensor provides five resonances in the frequency range from 0 to 5 GHz. The resonant frequencies are 0.56, 1.68, 2.72, 3.69 and 4.72 GHz, all used to measure the real permittivity of known samples with a sensitivity of 7, 20, 27, 43 and 50 MHz/permittivity, respectively. The sensor is used to measure dielectric samples with 20 x 20 mm2 areas with several thicknesses. Simulations and measurements demonstrate that the Hilbert fractal geometry can be used to design a multiband planar sensor for solid dielectric material characterization. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|