Effect of graphene/4H-SiC(0001) interface on electrostatic properties in graphene

Autor: Vito Raineri, Carmelo Vecchio, Emanuele Rimini, Sushant Sonde, Filippo Giannazzo, Rositsa Yakimova
Rok vydání: 2012
Předmět:
Zdroj: Physica. E, Low-dimensional systems and nanostructures
44 (2012): 93–96. doi:10.1016/j.physe.2011.01.002
info:cnr-pdr/source/autori:Sonde S, Vecchio C, Giannazzo F, Yakimova R, Raineri V, Rimini E/titolo:Effect of graphene%2F4H-SiC(0001) interface on electrostatic properties in graphene/doi:10.1016%2Fj.physe.2011.01.002/rivista:Physica. E, Low-dimensional systems and nanostructures (Print)/anno:2012/pagina_da:93/pagina_a:96/intervallo_pagine:93–96/volume:44
ISSN: 1386-9477
Popis: Electrostatic properties, quantum capacitance (C-q) and local density of states (LDOS) are evaluated for graphene on 4H-SiC(0 0 0 1) by measuring the local capacitance with Scanning Capacitance Spectroscopy (SCS). Two distinct samples were used for comparative study, viz., graphene exfoliated and deposited on 4H-SiC(0 0 0 1)-DG, and graphene grown epitaxially on 4H-SiC(0 0 0 1)-EG. We observed a distinctly lower screening length (r(scr)) and C-q while wider variations in the LDOS for EG. Such differences are attributed to the peculiar interface between EG/4H-SiC(0 0 0 1), which is known to be more or less defective having the presence of positive charges.
Databáze: OpenAIRE