Nonlinear Characterization of Waveguide Index Profile: Application to Soft-Proton-Exchange in LiNbO$_3$
| Autor: | Vladimir Ya. Shur, M. M. Neradovskiy, Hervé Tronche, Marc De Micheli, Dmitry Chezganov, Florent Doutre, P. Baldi, Evgeniy Vlasov, Tommaso Lunghi, E. A. Pashnina |
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| Přispěvatelé: | Institut de Physique de Nice (INPHYNI), Centre National de la Recherche Scientifique (CNRS)-Université Côte d'Azur (UCA)-Université Nice Sophia Antipolis (... - 2019) (UNS), COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-COMUE Université Côte d'Azur (2015-2019) (COMUE UCA), UrFU Institute of Natural Sciences and Mathematics, Ural Federal University [Ekaterinburg] (UrFU) |
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Materials science
WAVEGUIDES Lithium niobate Physics::Optics PREDICTION CAPABILITY 02 engineering and technology Refractive index profile Waveguide (optics) chemistry.chemical_compound 020210 optoelectronics & photonics Planar Optics HIGH-ORDER SPATIAL MODES 0202 electrical engineering electronic engineering information engineering NONLINEAR WAVEGUIDES NONLINEAR CHARACTERIZATION PHOTONICS [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] NONLINEAR OPTICS business.industry Second-harmonic generation Nonlinear optics OPTICAL WAVEGUIDE REFRACTIVE INDEX PROFILES PROTON EXCHANGED WAVEGUIDES MODE MATCHING METHOD Atomic and Molecular Physics and Optics LATERAL DISTRIBUTIONS chemistry REFRACTIVE INDEX NIOBIUM COMPOUNDS Photonics INTEGRATED PHOTONICS business Refractive index |
| Zdroj: | Journal of Lightwave Technology Journal of Lightwave Technology, Institute of Electrical and Electronics Engineers (IEEE)/Optical Society of America(OSA), 2021, 39 (14), pp.4695-4699. ⟨10.1109/JLT.2021.3077637⟩ J Lightwave Technol |
| ISSN: | 0733-8724 1558-2213 |
| DOI: | 10.1109/JLT.2021.3077637⟩ |
| Popis: | International audience; In integrated photonics, the precise knowledge of the waveguides refractive index profile is mandatory for the modeling of photonic chips and therefore implementing innovative circuits. Usual index profile determination relies on effective index measurement of propagating modes in planar waveguides coupled with numerical fitting tools. In this paper we propose an alternative technique based on the characterization of the second harmonic generation signature of a nonlinear waveguide. We include the characterization of high-order spatial modes showing their relevance to probe both vertical and lateral distributions. We finally provide an explicit profile ready-to-use for modeling soft-proton exchanged waveguides in lithium niobate and we test its prediction capability. Index Terms-Nonlinear optics, refractive index, optical waveguide, mode matching method. I. INTRODUCTION A NNEALED-PROTON exchange (APE) [1] and softproton exchange (SPE) [2] in lithium niobate (LN) are well-known fabrication techniques to create shallow optical waveguides [3], [4]. The integration of several components on the same chip requires repeatable fabrication process and precise knowledge of the refractive index profile in order to control and predict the optical performances [5]. All the current techniques Manuscript |
| Databáze: | OpenAIRE |
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