Quantitative sectioning and noise analysis for structured illumination microscopy
| Autor: | Tomasz S. Tkaczyk, Nathan Hagen, Liang Gao |
|---|---|
| Rok vydání: | 2011 |
| Předmět: |
Materials science
Optical sectioning 02 engineering and technology Signal-To-Noise Ratio 01 natural sciences Noise (electronics) law.invention 010309 optics Signal-to-noise ratio Optics Confocal microscopy law Image Interpretation Computer-Assisted ocis:(180.6900) Three-dimensional microscopy 0103 physical sciences Microscopy Lighting ocis:(110.4280) Noise in imaging systems business.industry Stray light ocis:(100.3010) Image reconstruction techniques Image Enhancement 021001 nanoscience & nanotechnology Atomic and Molecular Physics and Optics Photon counting ocis:(100.6640) Superresolution Modulation Research-Article ocis:(180.0180) Microscopy 0210 nano-technology business Algorithms |
| Zdroj: | Optics Express |
| ISSN: | 1094-4087 |
| DOI: | 10.1364/oe.20.000403 |
| Popis: | Structured illumination (SI) has long been regarded as a nonquantitative technique for obtaining sectioned microscopic images. Its lack of quantitative results has restricted the use of SI sectioning to qualitative imaging experiments, and has also limited researchers' ability to compare SI against competing sectioning methods such as confocal microscopy. We show how to modify the standard SI sectioning algorithm to make the technique quantitative, and provide formulas for calculating the noise in the sectioned images. The results indicate that, for an illumination source providing the same spatially-integrated photon flux at the object plane, and for the same effective slice thicknesses, SI sectioning can provide higher SNR images than confocal microscopy for an equivalent setup when the modulation contrast exceeds about 0.09. |
| Databáze: | OpenAIRE |
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