Generation of apodized X-ray illumination and its application to scanning and diffraction microscopy
| Autor: | Tetsuya Ishikawa, Yoshiki Kohmura, Takashi Kimura, Hiroki Nakamori, Yoshinori Nishino, Masashi Takei, Krishna P. Khakurel, Satoshi Matsuyama, Kazuto Yamauchi, Tomoya Sasaki, Takumi Goto |
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| Rok vydání: | 2016 |
| Předmět: |
Physics
Diffraction Nuclear and High Energy Physics Radiation Image quality business.industry X-ray 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Optics Apodization 0103 physical sciences Microscopy Köhler illumination 010306 general physics 0210 nano-technology business Instrumentation Beam (structure) |
| Zdroj: | Journal of synchrotron radiation. 24(Pt 1) |
| ISSN: | 1600-5775 |
| Popis: | X-ray science has greatly benefited from the progress in X-ray optics. Advances in the design and the manufacturing techniques of X-ray optics are key to the success of various microscopic and spectroscopic techniques practiced today. Here the generation of apodized X-ray illumination using a two-stage deformable Kirkpatrick–Baez mirror system is presented. Such apodized illumination is marked by the suppression of the side-lobe intensities of the focused beam. Thus generated apodized illumination was employed to improve the image quality in scanning X-ray fluorescence microscopy. Imaging of a non-isolated object by coherent X-ray diffractive imaging with apodized illumination in a non-scanning mode is also presented. |
| Databáze: | OpenAIRE |
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