Numerical computation of magnetic fields applied to magnetic force microscopy

Autor: Thomas Preisner, M. Greiff, Uzzal Binit Bala, Wolfgang Mathis
Jazyk: angličtina
Rok vydání: 2009
Předmět:
Engineering
Cantilever
Magnetism
Finite elements
Dewey Decimal Classification::600 | Technik::620 | Ingenieurwissenschaften und Maschinenbau
Microscopes
Magnetic force microscopes
Atomic force microscopy
Magnetic interactions
Attractive forces
Electromagnetism
Cantilever tips
Tip apices
Nanotechnology
ddc:510
Force calculations
Hysteresis models
Applied Mathematics
Finite element analysis
Finite element method
Dewey Decimal Classification::500 | Naturwissenschaften::510 | Mathematik
Computer Science Applications
Magnetic field
Classical mechanics
Computational Theory and Mathematics
Magnetic recording
ddc:620
Magnetic force microscope
Measurement errors
Electrical and Electronic Engineering
Magnetic materials
Micromagnetic models
FOS: Nanotechnology
Magneto-mechanical couplings
business.industry
Hysteresis
Design/methodology/approach
Nanocantilevers
Magnetic forces
Coupling (physics)
Magnetic force microscopy
Magnetic fields
Coupled circuits
Numerical methods
Magnetic distributions
Multi-scale problems
Numerical computations
business
Sensitive techniques
Zdroj: COMPEL-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1
DOI: 10.15488/2741
Popis: PurposeThe purpose of this paper is to introduce a method which allows the calculation of the interactions of tip and sample of a magnetic force microscope as a first step to increase the accuracy of this technique.Design/methodology/approachThe emerging magnetic interactions between the cantilever tip and an arbitrary magnetized sample can be evaluated by the use of several numerical methods. For modelling this magnetically and mechanically coupled multiscale problem the finite element method is implemented.FindingsThe evaluated magnetic fields interact in such a manner that a constructive overlap at the tip apex occurs. This leads to attractive forces acting on the cantilever.Research limitations/implicationsIn order to include the magneto‐mechanical coupling, the implementation of a detailed force calculation is necessary. Furthermore, a hysteresis model is not yet considered.Practical implicationsMagnetic force microscopy is a very sensitive technique. For instance, ideally the end of the tip consists of only one atom, but this is not realizable. Measurement errors cannot be avoided. This approach is the first step in developing an opportunity to soften them.Originality/valueOne opportunity to verify real‐time magnetic force microscope measurements is the comparison with theoretical considerations and calculations of the occurring magnetic distribution by using this technique. For this reason this paper deals with a new micromagnetic model to simulate the interactions between tip and sample of a scanning process of a magnetic force microscope.
Databáze: OpenAIRE