Numerical computation of magnetic fields applied to magnetic force microscopy
Autor: | Thomas Preisner, M. Greiff, Uzzal Binit Bala, Wolfgang Mathis |
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Jazyk: | angličtina |
Rok vydání: | 2009 |
Předmět: |
Engineering
Cantilever Magnetism Finite elements Dewey Decimal Classification::600 | Technik::620 | Ingenieurwissenschaften und Maschinenbau Microscopes Magnetic force microscopes Atomic force microscopy Magnetic interactions Attractive forces Electromagnetism Cantilever tips Tip apices Nanotechnology ddc:510 Force calculations Hysteresis models Applied Mathematics Finite element analysis Finite element method Dewey Decimal Classification::500 | Naturwissenschaften::510 | Mathematik Computer Science Applications Magnetic field Classical mechanics Computational Theory and Mathematics Magnetic recording ddc:620 Magnetic force microscope Measurement errors Electrical and Electronic Engineering Magnetic materials Micromagnetic models FOS: Nanotechnology Magneto-mechanical couplings business.industry Hysteresis Design/methodology/approach Nanocantilevers Magnetic forces Coupling (physics) Magnetic force microscopy Magnetic fields Coupled circuits Numerical methods Magnetic distributions Multi-scale problems Numerical computations business Sensitive techniques |
Zdroj: | COMPEL-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1 |
DOI: | 10.15488/2741 |
Popis: | PurposeThe purpose of this paper is to introduce a method which allows the calculation of the interactions of tip and sample of a magnetic force microscope as a first step to increase the accuracy of this technique.Design/methodology/approachThe emerging magnetic interactions between the cantilever tip and an arbitrary magnetized sample can be evaluated by the use of several numerical methods. For modelling this magnetically and mechanically coupled multiscale problem the finite element method is implemented.FindingsThe evaluated magnetic fields interact in such a manner that a constructive overlap at the tip apex occurs. This leads to attractive forces acting on the cantilever.Research limitations/implicationsIn order to include the magneto‐mechanical coupling, the implementation of a detailed force calculation is necessary. Furthermore, a hysteresis model is not yet considered.Practical implicationsMagnetic force microscopy is a very sensitive technique. For instance, ideally the end of the tip consists of only one atom, but this is not realizable. Measurement errors cannot be avoided. This approach is the first step in developing an opportunity to soften them.Originality/valueOne opportunity to verify real‐time magnetic force microscope measurements is the comparison with theoretical considerations and calculations of the occurring magnetic distribution by using this technique. For this reason this paper deals with a new micromagnetic model to simulate the interactions between tip and sample of a scanning process of a magnetic force microscope. |
Databáze: | OpenAIRE |
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