| Autor: |
Cora Salm, Kevin M. Batenburg, Emre Ozturk, Mike J. Dikkers, Jurriaan Schmitz |
| Přispěvatelé: |
Integrated Devices and Systems |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
2019 IEEE International Integrated Reliability Workshop, IIRW 2019 |
| DOI: |
10.1109/iirw47491.2019.8989885 |
| Popis: |
In this work the failure modes and mechanisms are investigated of a commercially available RFID tag, when it is exposed to extreme temperatures well beyond specifications. Both erroneous functioning and malfunctioning are observed after a thermal cycle exposing the tag to an elevated temperature in the 300–550 ° C range. Void formation is the dominant failure, leading to a complete malfunction of the tag. Sporadically, the RFID tag returns a wrong identification code after extreme thermal cycling. This effect is caused by relatively weak bits flipping from “1” to “0” and seems consistent with existing retention models. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
